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Sometimes the surface is not enough, Go deeper with Lucent™ 𝕋 AFM

Lucent™ 𝕋

Automic Force Microscope

Lucent™ Analytical Software to Bring out the Unseen

Lucent™

Analytical Software

From Millimeter to Nanometer

Products

Lucent™ 𝕋 AFM

A unique tabletop AFM combining AFM with White Light Interferometry and Full Field Optical Coherence Tomography, opens novel class of applications in both research and manufacturing. Accompanied by our full 3d data analyzer, this AFM let’s you get inside the sample like no other model.

  • Integrated WLI and FFOCT with AFM
  • Switch between AFM, WLI and LSM, without losing sample location
  • 3d data analysis software to visualize in 3d and make measurements
  • Add spectrometry data (material related information) to height data
  • Dedicated WLI tab in the AFM data acquisition software
  • HDF file format saves raw data, 2d representations, reconstructed volume and metadata in one file – compatible with our 3d analytics software and ‘Gwyddion’

Scanner and positioner

  • Range (XYZ): 30 µm (Open Loop); 3 µm (Small range setting)
  • Resolution (XYZ): 0.5 nm (Open Loop); 0.05nm (Small range setting)
  • Z Noise: 100 pm RMS

  • Motorized sample (XYZ) and cantilever (Z) positioning: 12 mm; step size< 0.5 µm.
  • Sample size

  • Open design allows ample space for a broad class of samples (5 cm x 5 cm x 1 cm).
  • Electronics and controller

  • Dedicated FPGA controller with 10kHz loop rate, 19 bits eq AI/AO, Max. image size: 2048 px x 2048 px.
  • Cantilever sensing

  • Beam deflection with high sensitivity photo detector,

  • Typical sensitivity: Force mode – 1 mV/nm, RMS 0.5 mV (150 Hz b/w), Dynamic mode – 10

  • mV/nm, RMS 2.5 mV (150 Hz b/w)
  • Optical microscope

    10x / 0.3 NA long working distance objective, Working distance 16 mm, 400 µm × 300 µm field of view, Integrated laser & detector for cantilever deflection sensing.

    WLI & FFOCT

  • Lateral resolution: ~ 1 µm (diffraction limited).

  • Z resolution: ~ 1 nm (WLI), ~ 100nm (OCT).

  • Time of scan: ~ 1 minute (w/o averaging).

  • Reconstruction method: Z gradient / Hilbert with phase correction.
  • Scan size:

  • < 400 µm X 300 µm (XY plane), Z-step: < 1000 steps, 1-1000 nm.
  • Corelation Imaging *:

    • AFM, WLI & LSM scan are precisely aligned for co-relational imaging.•
    • Dynamic studies easily accomplished like AFM tip based indentation, perturbation etc.
    • Dynamic range from mm to nm can be achieved.

    Software Features

    𝕋 - Model Control GUI

    • Multiple tabs for easy navigation: AFM Scan settings, Oscillation control, Oscilloscope, Soft instruments, Motors & camera, LSM scan, Graphing.
    • Advanced, WLI +OCT settings.
    • AFM modes: Contact mode, Amplitude Modulation, Frequency Modulation, STM.
    • Configurable modes through soft instruments: Piezo mode, Force Modulation, Kelvin probe, Electrostatic etc.

    Data Format

    • HDF for saving all acquisition channels, associated graphs and meta data in a single file.
    • Seamless analysis with Gwydion SPM Package & Shilps 3D-reconstruction package.

    3D Reconstruction & visualization

    • Hilbert & gradient algorithms for 3D reconstruction.
    • Handling big data: 1Gb files can be analyzed readily.
    • GPU accelerated reconstruction & Visualization; topography reconstruction allows layer quantifications.
    • Material analysis from spectral data.
    • Liquid chamber made of inert material for biological studies
    • Electrochemical chamber with electrode connections
    • Soft Instruments module includes sine wave modulation for tip or sample, a low frequency lock-in amplifier (set to f or 2f) and a PI controller
    • STM current amplifier (Sensitivity - 100mV/nA, Range - 100 nA, Bandwidth – 150 Hz)
    • Scanner options - closed loop; Smaller range - 5 µm x 5 µm x 5 µm
    Brochure

    Lucent™ AFM

    The Lucent model is designed to seamlessly integrate AFM with optical microscopy for correlated microscopy, sample search and newer insights. It’s a feature rich automated AFM for a wide range of research applications, at an affordable price tag.

    • Integrated optical microscope and Laser Scanning Microscope mode
    • Automated sample and tip positioning
    • Soft instruments allow user configurable advanced experiments
    • Large feature imaging capability
    • Comprehensive AFM data acquisition software
    • HDF file format saves images, graphs and metadata in one file – compatible with ‘Gwyddion’, the widely used SPM analysis software

    Scanner and positioner

  • Range (XYZ): 30 µm (Open Loop); 3 µm (Small range setting)

  • Resolution (XYZ): 0.5 nm (Open Loop); 0.05nm (Small range setting)

  • Z Noise: 100 pm RMS

  • Motorized sample (XYZ) and cantilever (Z) positioning: 12 mm; step size< 0.5 µm.
  • Sample size

    Open design allows ample space for a broad class of samples (5 cm x 5 cm x 1 cm).

    Electronics and controller

    Dedicated FPGA controller with 10kHz loop rate, 19 bits eq AI/AO, Max. image size: 2048 px x 2048 px.

    Cantilever sensing

  • Beam deflection with high sensitivity photo detector,

  • Typical sensitivity: Force mode – 1 mV/nm, RMS 0.5 mV (150 Hz b/w), Dynamic mode – 10 mV/nm, RMS 2.5 mV (150 Hz b/w)
  • Optical microscope

    10x / 0.3 NA long working distance objective, Working distance 16 mm, 400 µm × 300 µm field of view, Integrated laser & detector for cantilever deflection sensing.

    Laser Scanning Microscope

  • Wavelength & power: 405 nm, ~ 0.5 mW on sample

  • Spot size: 2.2 µm diffraction limited

  • Motorized scanning range: 10 mm x 10 mm
  • Software Features

    GUI:

  • Multiple tabs for easy navigation

  • AFM Scan settings, Oscillation control, Motors & Camera, LSM scan, Graphing, Advanced.
  • AFM modes:

    Contact mode, Amplitude Modulation, Frequency Modulation, STM.

    AFM advanced modes:

  • User selectable channel for Z-control and an additional channel for data collection.

  • Conductive AFM, Magnetic Force, Electrical Force.

  • Shift Mode for point by point Voltage or Z perturbation
  • User inspired features:

    Tip protection, scan direction control, slope correction, multi graphs.

    • Liquid chamber made of inert material for biological studies
    • Electrochemical chamber with electrode connections
    • Soft Instruments module includes sine wave modulation for tip or sample, a low frequency lock-in amplifier (set to f or 2f) and a PI controller
    • STM current amplifier (Sensitivity - 100mV/nA, Range - 100 nA, Bandwidth – 150 Hz)
    • Scanner options - closed loop; Smaller range - 5 µm x 5 µm x 5 µm
    Brochure

    Application Notes

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    Shilps Sciences

    Shilps Sciences, a deep science company based out of Bangalore, India, develops novel solutions for imaging and characterization at the nano & micro scale.

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