Advanced Microscopy Applications


Model: Lucent T model

Modes used – AFM, WLI

Micro and nano-indentation are routine methods to measure the mechanical strength of materials. The Lucent T model was used to measure the surface profile post micro-indentation. WLI is a good solution for micro-indentation with depth above 10 µm and indent area 100 µm x 100 µm where the AFM can get restricted due to scan area or tip height. The AFM is useful to image the details in smaller areas. Together the WLI and AFM modes provide a comprehensive map of the indentation region which can be used for quantitative modeling.